International Workshop on Testing and Verification of Programmable Chips (TVPC 2025)

Description

Programmable logic is an important achievement in the development of modern computer application technology. Compared with ASIC technology, programmable logic resources can be flexibly customized and reduced, with the advantages of high performance and low power consumption, and low cost and low risk. In the recent years, it has been widely used in high-reliability fields, consumer electronics, Internet of Things, and other intelligent field.

With the increasing complexity and large-scale increase of functions, the test sufficiency and test efficiency of programmable logic are very important, which will directly affect the safety and reliability of products. The International Workshop on Testing and Verification of Programmable Chips (TVPC) aims to provide a forum to bring together researchers, practitioners and experts to present and discuss their relevant results or experience in programmable logic chip verification, and the special emphasis will be put on the intersection of four fields.

Topics

FPGA/SOPC Testing and Validation

• Accelerated verification and simulation
• Modeling and Model assessment
• IP verification
• Debugging and Verification Visualization
• Timing Analysis and Cross-Clock Domain Analysis
• SOPC Software and hardware co-verification, Coverage analysis, testing methods and test case generation
• FPGA/SOPC functional, physical, and comprehensive verification platform

FPGA/SOPC Formal Methods

• Formal modeling and Model assessment
• Formal coverage analysis
• Property sanity check
• SOPC/FPGA Formal verification
• Equivalence analysis

FPGA/SOPC Safety and Reliability

• Single particle effect and Total dose effect detection and prevention
• SRAM/FLASH/Anti-fuse FPGA safety design
• Safety fault injection and analysis
• FPGA/SOPC Information security, side channel attack prevention
• Safety and reliability Testing methods

New Trend in Testing

• AI and intelligent IC verification
• AI toward autonomous testing
• Machine learning and its application in testing
• Testing in emerging fields, including internet of things and automotive electronics
• Functional safety in automotive electronics, ISO 26262

Submission

Authors are invited to submit original unpublished research papers as well as industrial practice papers. Simultaneous submissions to other conferences are not permitted. Detailed instructions for electronic paper submission, panel proposals, and review process can be found at QRS submission.

Each submission can have a maximum of ten pages. It should include a title, the name and affiliation of each author, a 300-word abstract, and up to 6 keywords. Shorter version papers (up to six pages) are also allowed.

All papers must conform to the QRS conference proceedings format (PDF | Word DOCX | Latex) and Submission Guideline set in advance by QRS 2025. At least one of the authors of each accepted paper is required to pay the full registration fee and present the paper at the workshop. Submissions must be in PDF format and uploaded to the conference submission site. Arrangements are being made to publish extended version of top-quality papers in selected SCI journals.

Program Committee Chair

Jacob Abraham

University of Texas at Austin, USA

Organizing Committee Chair

Jinbo Wang

Chinese Academy of Sciences

, China

Zhiyi Zhang

Nanjing University of Aeronautics and Astronautics, China

Program Committee

Previous TVPC

• TVPC 2022 - Guangzhou (in conjunction with QRS 2022)
• TVPC 2021 - Hainan Island (in conjunction with QRS 2021)
• TVPC 2020 - Macau (in conjunction with QRS 2020)
• TVPC 2019 - Sofia (in conjunction with QRS 2019)